Tech Xplore on MSN

AI model extracts hidden semiconductor properties from simple transistor tests in under 1 millisecond

A tandem neural network capable of inferring key physical parameters of semiconductor materials from simple transistor measurements has been developed, as reported by researchers from the Institute of ...
IEEE

Automatic Monitoring and Controlling of Substation using LabVIEW

Abstract: Substation automation is critical for enhancing operational reliability, minimizing response to faults, and protecting assets. Substation control currently relies heavily upon the ...
EDN

Using an oscilloscope’s time, frequency, and statistical measurement domains

Multiple domains provide designers and test engineers with complementary views of acquired signals. Oscilloscopes originated as instruments that measure electrical signals in the time domain. The ...
IEEE

15.10 A Vertical-Cell-Transistor-Based 4F

Abstract: The paper presents a 16Gb SDRAM with a vertical-channel-transistor-based 4F 2 cell and cell-on-peripheral (COP) architecture. Wafer-to-wafer hybrid copper bonding is applied to COP, which ...