IEEE

Integrating Deep Learning and SHAP for Breast Cancer Classification and Biomarker Discovery Using Gene Expression Data

Abstract: This study explores the application of deep learning models combined with SHAP (SHapley Additive exPlanations) for breast cancer classification using gene expression data. Our model ...
IEEE

Wafer Defect Classification Algorithm With Label Embedding Using Contrastive Learning

Abstract: Classifying wafer defects in the wafer manufacturing process is increasingly critical for ensuring high-quality production, optimizing processes, and reducing costs. Most existing methods ...