Abstract: Learning over time for machine learning (ML) models is emerging as a new field, often called continual learning or lifelong Machine learning (LML). Today, deep learning and neural networks ...

Abstract: Classifying wafer defects in the wafer manufacturing process is increasingly critical for ensuring high-quality production, optimizing processes, and reducing costs. Most existing methods ...

This study highlights the potential for using deep learning methods on longitudinal health data from both primary and ...