EDN

Test: the next big SoC challenge

With system-on-chip design productivity partially resolved by using external intellectual property (IP) and improved EDA, design verification and test have emerged as the new SoC bottlenecks.
EDN

Test vendors address expanding SoC issues

SAN JOSE, Calif. — Representatives of semiconductor characterization and test vendors offered their experiences and insights into the problems of testing ever-larger ICs here Thursday afternoon (July ...
Nasdaq

Advantest Celebrates 25th Anniversary of Industry-Leading V93000 SoC Test Platform

TOKYO, Aug. 08, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today observed the 25th anniversary of its flagship V93000 system-on-chip (SoC) ...
Electronic Design

Tackling Next-Generation RF SOC Test

Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
Semiconductor Engineering

Supporting Multiple Time Domains In SoC Production Test

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...
Electronic Design

Penny-A-Secnd SoC DFT Tester Saves Time

At $399,000, the 93000 SoC (system-on-a-chip) DFT (design for test) series promises users a one-cent-per-second cost of test. As such, this version of the Agilent Technologies 93000 SoC platform would ...
Nasdaq

Advantest Unveils New Ultra-High-Current Power Supply for V93000 EXA Scale SoC Test System

TOKYO, May 15, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the newest addition to its portfolio of power supplies for the ...