Semiconductor Engineering

Wafer Probe Struggles To Adapt To Multi-Die Assemblies

Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.
Hip-Hop Wired

Several Docs About Diddy's Federal Probe Are In The Works

Surviving Diddy, the documentary? It looks like those docs are coming. Spotted on TMZ, multiple docs detailing Diddy’s federal probe that has led to the once highly sought-after mogul losing multiple ...
SpaceRef

Multi-Needle Langmuir Probe Will Study Space Weather Around Earth From ISS

Launching soon on one of the next cargo missions to the International Space Station is the Multi-Needle Langmuir Probe that will measure the “weather” in the upper atmosphere. The experiment is part ...
Electronic Design

Multi-DUT probe card targets nonmemory devices

The MEMS-based Mx-FinePitch (Mx-FP) Probe Card addresses the ultra-fine-pitch testing needs of SOC and logic devices. Built for multi-DUT testing in high-volume production environments, the ...