Atomic Force Microscopy (AFM) is an established nanoscale imaging technique, offering a topographic map of a surface sample high spatial resolution. The main drawback, until recently, of using AFM has ...

Submicron and nanoscale chemical identification of semiconductor materials, particularly organic ones, poses a considerable challenge in the analysis of devices and also in the process control and ...

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Microplastics have recently gained significant scientific and political attention and are now regarded as a critical environmental and health concern. This has led to a surge in research on ...