Reliability Patterns That Sustain Robotics and Industrial Automation

Reliability is expected when systems are new. The real test comes after deployment and years of continuous operation.
Electronic Design

Simulation Mismatches Can Foul Up Test-Pattern Verification

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
Electronic Design

Using Timing Constraints For Generating At-Speed Test Patterns

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...
Semiconductor Engineering

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...
Semiconductor Engineering

Power-Aware Test Vector Porting For Production ATE

Power management in contemporary system-on-chip (SoC) designs is almost unimaginably complex. Processors and other chip cores turn on and off as needed. Advanced features such as dynamic voltage and ...