(Nanowerk News) Monolayer crystals, often being referred as 2D crystals or 2D materials, possess the unique characteristic of having a single layer of regular atomic structure. And the more regular ...

October 26, 2012. Aegis Software announced that Sechan Electronics Inc., a contract manufacturing services company, chose Aegis’ Quality System as a replacement for Sechan's paper-based defect mapping ...

Electron-beam inspection is proving to be indispensable for finding critical defects at sub-5nm dimensions. The challenge now is how to speed up the process to make it economically palatable to fabs.

Researchers have created a lightweight, cable-climbing robot equipped with a computer vision system to detect surface defects on bridge stay cables. The system achieved over 92 % detection precision ...

As device sizes continue to increase on devices at 2x nm design rule and beyond and high wafer stress is worsening due to multi-film stacking in the vertical memory process, we observe an increasing ...